SN74BCT8373ANT

Part Number:
SN74BCT8373ANT
Manufacturer:
Texas Instruments
Description:
IC SCAN TEST DEVICE LATCH 24-DIP
Encapsulation:
-
Package:
-
Quantity:
0
RoHS Status:
Supported
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MOQ: 1

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Product Parameters

Mounting Type Through Hole
Operating Temperature 0°C ~ 70°C
Number of Bits 8
Package / Case 24-DIP (0.300", 7.62mm)
Supplier Device Package 24-PDIP
Supply Voltage 4.5V ~ 5.5V
Logic Type Scan Test Device with D-Type Latches